Welcome to the official EMsoft web page! On this page you will find links to the source code, help pages, SDK build instructions, nightly builds, the EMsoft Google Users Group, and more. This page will be updated frequently to always have the latest information.
Please note that the repository locations for both the Superbuild and the main repository were changed on August 20,2018; both repositories are now part of the EMsoft-org organization.
This repository contains mostly cMake code that can be used to bootstrap the creation of the Software Developer Toolkit (SDK) necessary to properly compile the EMsoft suite of programs.
There are many changes in Release 5.0, so developers will need to rebuild the SDK from scratch.
This repository contains all the publicly released source code as well as various resource files. The current version of the code is 5.0 (October 14, 2019). This repository always contains a functioning version of the complete public EMsoft package.
This source code release (5.0) has been assigned a permanent DOI number:
The previous version of the source code (4.2) has been assigned the following DOI number:
We are in the process of creating detailed help pages for all of the most important EMsoft programs, in particular the suite of programs for EBSD pattern simulation and dictionary indexing. This is a time consuming task, so any help would be appreciated!
Every night, the complete package (in its current version) is built and executables are made available for download (Mac and Windows). The most current executables should be in the most recent folder, but occasionally a beta build may fail, in which case an earlier version may need to be selected.
The Google EMsoft users group is a private group (you can request access); you will find messages from other users, questions and answers regarding installation and compilation, and so on. New releases are announced through this forum as well as on this page.
On this page you can find information regarding the continuous and nightly builds of EMsoft; if all boxes are green, then the builds were successful. This site is informational only.
We offer pre-compiled IDL (Interactive Data Language) apps for Windows, Mac OS X, and Linux (all 64 bit) . These apps can be used to visualize some of the EMsoft data files, and carry out an interactive fit of EBSD detector parameters. We are still in the testing phase for these apps, so if you try them and encounter issues, please let us know.
If you are using a Mac, then the download above will not work due to Apple's security systems. Instead, you should use the "curl" program to download the zip file in a Terminal window using the following command:
curl "http://vbff.materials.cmu.edu/wp-content/uploads/2019/01/VMappsOSX.zip" -O
The Mac OS X and Linux versions of the VM apps should work fine on your system; the Windows 10 version has been reported not to work (Feb. 2019) and we are trying to resolve this issue.
COMING SOON: If you are currently using EMsoft and you obtained a nice result, perhaps something you added to a publication, please let us know about it. We will host a list of links to pages describing exciting results and/or links to publications.
List of publications that use, are related to, or were enabled by EMsoft
- 1P.G. Callahan and M. De Graef, "Dynamical EBSD Patterns Part I: Pattern Simulations," Microscopy and Microanalysis, vol. 19, pp. 1255-1265 (2013)
- 2S.D. Carnevale, J.I. Deitz, T.J. Grassman, J.A. Carlin, Y.N. Picard, M. De Graef, and S.A. Ringel. “Rapid Misfit Dislocation Characterization in Heteroepitaxial III-V/Si Thin Films by Electron Channeling Contrast Imaging”. Appl. Phys. Lett. 104 (2014), p. 232111.
- 3J. Deitz, S. Carnevale, M. De Graef, Y.N. Picard, S.A. Ringel, T. Grassman, and D.W. McComb. “Using electron channeling contrast imaging for misfit dis- location characterization in heteroepitaxial III-V/Si thin films”. Microscopy and MicroAnalysis 20 (suppl 3) (2014), pp. 552-553
- 4Y.N. Picard, M. Liu, J. Lammatao, R. Kamaladasa, and M. De Graef. “Theory of dynamical electron channeling contrast images of near-surface crystal defects”. Ultramicroscopy 146, 71-78 (2014).
- 5D. Rosca, A. Morawiec, and M. De Graef. “A new method of constructing a grid in the space of 3D rotations and its applications to texture analysis”.Modeling and Simulations in Materials Science and Engineering 22, 075013 (2014).
- 6S.D. Carnevale, J.I. Deitz, J.A. Carlin, Y.N. Picard, M. De Graef, S.A. Ringel and T.J. Grassman. "Applications of electron channeling contrast imaging for rapid characterization of extended defects in III-V/Si heterostructures". IEEE J. Photovoltaics. PP:99 (2014), p. 1-7.
- 7Y.H. Chen, Park S.U., D. Wei, G. Newstadt, M. Jackson, J.P. Simmons, M. De Graef, and A.O. Hero. “A dictionary approach to the EBSD indexing problem”. Microsc. MicroAnal. 21, 739-752 (2015).
- 8S.I. Wright, M.M. Nowell, S.P. Lindeman, P.P. Camus, M. De Graef, and M.A. Jackson. “Introduction and comparison of new EBSD post-processing methodologies”. Ultramicroscopy, 159, 81-94 (2015).
- 9D.J. Rowenhorst, A.D. Rollett, G.S. Roher, M.A. Groeber, M.A. Jackson, P.J. Konijnenberg, and M. De Graef. "Tutorial: consistent representations of and conversions between 3D rotations". Modeling and Simulations in Materials Science and Engineering, 23, 083501 (2015).
- 10A. Wang and M. De Graef. "Modeling dynamical electron scattering with Bethe potentials and the scattering matrix". Ultramicroscopy, 160, 35-43 (2015)
- 11Y.H. Chen, D. Wei, G. Newstadt, M. De Graef, J.P. Simmons, and A.O. Hero. “Parameter estimation in spherical symmetry groups”. IEEE. Sign. Proc. Lett. 22, 1152-1155 (2015).
- 12M. Chapman, P.G. Callahan, and M. De Graef. “Determination of sample surface topography using electron back-scatter diffraction patterns”. Scripta Mater., 120, 23-26 (2016).
- 13J.I. Deitz, S.D. Carnavale, M. De Graef, D.W. McComb, and T.J. Grassman, "Characterization of encapsulated quantum dots via electron channeling contrast imaging". Applied Physics Letters, 109, 062101 (2016)
- 14S. Singh and M. De Graef, "Orientation sampling for dictionary-based diffraction pattern indexing methods". MSMSE 24, 085013 (2016)
- 15B. Jackson, J. Christensen, S. Singh, M. De Graef and D. Fullwood, "Performance of Dynamically Simulated Reference Patterns for Cross Correlation EBSD". Microscopy & MicroAnalysis, 22, 789-802 (2016).
- 16L. Hansen, B. Jackson, D. Fullwood, S.I. Wright, M. De Graef, E. Homer and R. Wagoner,. "Influence of noise generating factors on cross correlation EBSD measurement of GNDs", Microscopy & MicroAnalysis, 23, 1-12 (2017).
- 17M.J. Burch, C.M. Fancher, S. Patala, E.C. Dickey, and M. De Graef, "Mapping 180° ferroelectric domains unsing electron backscatter diffraction and dynamical scattering simulations". Ultramicroscopy, 173, 47-51 (2017)
- 18S. Singh and M. De Graef. "Dictionary Indexing of Electron Channeling Patterns". Microsc. MicroAnal., 23, 1-12 (2017)
- 19P.G. Callahan, M.P. Echlin, M.A. Groeber, T.M. Pollock, and M. De Graef. "3D texture visualization approaches: Theoretical Analysis and Examples". J. Applied Crystallography, 50, 430-440 (2017).
- 20Marquardt, K. and De Graef, M. and Singh, S. and Marquardt, H. and Rosenthal, A. and Hiraga, T.. "Quantitative electron backscatter diffraction (EBSD) data analyses using the dictionary indexing (DI) approach: overcoming indexing difficulties in geological materials", American Mineralogist, 102, 1843-1855 (2017). DOI: http://dx.doi.org/10.2138/am-2017-6062
- 21F. Ram, S. Singh, S.I Wright and De Graef. "Error Analysis of Crystal Orientations Obtained by the Dictionary Approach to EBSD Indexings", Ultramicroscopy, 181, 17-26 (2017).
- 22J. Wittkamper, Z. Xu, B. Kombaiah, F. Ram, M. De Graef, J.R. Kitchin, G.S. Rohrer, and P.A. Salvador. "Competitive Growth of α-PbO2 and Rutile Polymorphs of SnO2 on Different Orientations of Columbite CoNb2O6 Substrates", Crystal Growth & Design, 17, 3929-3939 (2017).
- 23P.G. Callahan, M. Echlin, T.M. Pollock, F. Ram, S. Singh, and M. De Graef. “3D Texture Visualization Approaches: Applications to Nickel and Titanium Alloys”. J. Appl. Crystal. 50, 1267-1279 (2017).DOI: http://dx.doi.org/10.1107/S1600576717010470
- 24S. Singh, F. Ram, and M. De Graef. “Application of Forward Models to Crystal Orientation Refinement”. J. Appl. Crystall. 50, 1664-1676 (2017). DOI: http://dx.doi.org/10.1107/S1600576717014200
- 25F. Ram and M. De Graef. “Phase Differentiation by Electron Backscatter Diffraction using the Dictionary Indexing Approach”. Acta Materialia. 144, 352-364 (2018).
- 26S. Singh, M. Mills, and M. De Graef. “Dynamical Scattering Image Simulations for Two-Phase gamma-gamma' Microstructures: A Theoretical Model”. Ultramicroscopy. 185, 32-41 (2018).DOI: https://doi.org/10.1016/j.ultramic.2017.11.008
- 27P.G. Callahan, J.-C. Stinville, E. Yao, M. Echlin, S. Daly, D.S. Gianola, M. De Graef, and T.M. Pollock. “Transmission scanning electron microscopy: Defect observations and image simulations”. Ultramicroscopy 186, 49-61 (2018). DOI: https://doi.org/10.1016/j.ultramic.2017.11.004
- 28E. Pascal, S. Singh, P.G. Callahan, and M. De Graef. “Energy-Weighted Dynamical Scattering Simulations of Back-Scattered Electron Diffraction Modalities”. Ultramicroscopy 187, 98-106 (2018). DOI: https://doi.org/10.1016/j.ultramic.2018.01.003
- 29F. Ram and M. De Graef. “Energy dependence of the spatial distribution of inelastically scattered electrons in backscatter electron diffraction”. Phys. Rev. B 97, 134104 (2018).
- 30S. Singh, Y. Guo, B. Winiarski, T. Burnett, P.J. Withers, and M. De Graef. “High resolution low kV EBSD of heavily deformed and nanocrystalline Aluminium by dictionary-based indexing”. Nature Scientific Reports8:10991 (2018). doi 10.1038/s41598-018-29315-8
- 31P. Acar, V. Sundararaghavan, and M. De Graef. “Computational Modeling of Crystallographic Texture Evolution over Cubochoric Space”. MSMSE.26, 065012 (2018). doi 10.1088/1361-651X/aad20b
- 32D. Jha, S. Singh, R. Al-ahrani, W.-K. Liao, A. Choudhary, M. De Graef and A. Agrawal. "Extracting Grain Orientations from EBSD Patterns of Polycrystalline Materials Using Convolutional Neural Networks". Microsc. MicroAnal., 24:497-502 (2018)
- 33A. Nicolay, J.M. Franchet, J. Cormier, H. Mansour, M. De Graef, A. Seret, and N. Bozzolo, “Discrimination of dynamically and post-dynamically recrystallized grains based on EBSD data. Application to Inconel 718”. J. Microsc. 273:135-147 (2019).
- 34M. De Graef. “Forward Modeling” Chapter 4 in “Statistical Methods for Materials Science: The Data Science of Microstructure Characterization”. Eds. J.P. Simmons, L.F. Drummy, C.A. Bouman, and M. De Graef. PAges 47-62, Taylor & Francis Group (2019) [ISBN-13: 978-1-4987-3820-0]
- 35T. Vermeij, M. De Graef and J. Hoefnagels. "Demonstrating the potential of highly accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction". Scripta Mat. 162:266-271 (2019).
- 36T. Francis, I. Chesser, S. Singh, E.A. Holm and M. De Graef. "A New Octonion Metric for Grain Boundary Interpolations". Acta Materialia, 166:135-147 (2019). DOI: 10.1016/j.actamat.2018.12.034
- 37S. Singh, F. Ram, W. Lenthe, and M. De Graef. “Dictionary-based Indexing of Large Scale Electron Back-Scatter Diffraction Data Sets”. Book Chapter in Big, Deep, Smart Data in Physical Sciences (2019 (in press)).
Contribute to EMsoft
You can contribute your own code to the EMsoft project in one of two ways:
- 1Obtain your own GitHub ID and fork the EMsoft-org/EMsoft repository into your own account. Then clone your copy of EMsoft onto your own computer, and start working; as you add code, commit and push to your copy of EMsoft on GitHub. Try to organize your additions in separate branches, so that you have a clear overview of all the changes/additions you are making. When you feel you have a working piece of code (i.e., code that compiles and executes correctly) that might be of use to others, commit and push it to your repository and send a pull request to the main repository; there are plenty of manuals on the web that explain how to do this. I will then evaluate your code and, assuming everything works well, import it into the main EMsoft repository.
- 2There is a second private repository that is used by a handful of developers to augment EMsoft on a continuous basis; this is our testing ground for future releases. Programs in the private repository are compiled on a nightly schedule to make sure there are no build issues, but the source code is not released until we have completed extensive testing. If you wish to become a member of the core developer group, please contact me (degraef_at_cmu.edu) directly.
The open source EMsoft package is based on original code that was developed as part of the Introduction to Conventional Transmission Electron Microscopy text book written by the PI (2003). While some of the original crystallography code dates back to 1998, most of this code has been rewritten by now, and the current version was made possible with financial support from:
- ONR N00014-12-1-0075
- AFOSR MURI FA9550-12-1-0458
- Vannevar Faculty Bush Fellowship ONR N00014-16-1-2821
The EMsoft package uses the BSD2 copyright license which reads as follows:
Copyright (c) 2013-2019, Marc De Graef Research Group/Carnegie Mellon University
All rights reserved.
Redistribution and use in source and binary forms, with or without modification, are
permitted provided that the following conditions are met:
- Redistributions of source code must retain the above copyright notice, this list
of conditions and the following disclaimer.
- Redistributions in binary form must reproduce the above copyright notice, this
list of conditions and the following disclaimer in the documentation and/or
other materials provided with the distribution.
- Neither the names of Marc De Graef, Carnegie Mellon University nor the names
of its contributors may be used to endorse or promote products derived from
this software without specific prior written permission.
THIS SOFTWARE IS PROVIDED BY THE COPYRIGHT HOLDERS AND CONTRIBUTORS "AS IS"
AND ANY EXPRESS OR IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE
IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE
ARE DISCLAIMED. IN NO EVENT SHALL THE COPYRIGHT HOLDER OR CONTRIBUTORS BE
LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL
DAMAGES (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR
SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER
CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY,
OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE
USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.