Research Articles

On this page we list all peer reviewed publications that were generated with VBFF support.  When published, DOI links will be included.

Under review or in preparation

  • 1
    A. Leff, S. Singh, P. Kc, M. Taheri, and M. De Graef. "A dictionary-based indexing method for precession electron diffraction patterns". Microscopy and Microanalysis (2019 (in preparation))
  • 2
    B. Decost, S. Singh, E.A. Holm, and M. De Graef. “Indexing of Electron Channeling Patterns using Convolutional Neural Nets”. Ultramicroscopy (2019 (in preparation))
  • 3
    W.C. Lenthe and M. De Graef. "Perceptually Uniform Color Maps for the Disk, Sphere, and Ball". IEEE Trans. Vis. Comp. Graph. (2019 (under review))

Published or in press in 2020

  • 1
    I. Chesser, T. Francis, M. De Graef and E.A. Holm. "Visualizing grain boundary properties via octonions", Scripta Mater (2020 (in press))
  • 2
    C. Lafond, T. Douillard, M. De Graef, S. Cazottes, P. Steyer, C. Langlois. "Towards large scale orientation mapping using the eCHORD method". Ultramicroscopy 208, 112854 (2020).  https://doi.org/10.1016/j.ultramic.2019.112854

Published or in press in 2019

  • 1
    T. Vermeij, M. De Graef and J. Hoefnagels. "Demonstrating the potential of highly accurate absolute cross-grain stress and orientation correlation using Electron Backscatter Diffraction." Scripta Mater. 162, 266-271, (2019) DOI: https://doi.org/10.1016/j.scriptamat.2018.11.030
  • 2
    T. Francis, I. Chesser, S. Singh, E.A. Holm and M. De Graef. "A New Octonion Metric for Grain Boundary Interpolations". Acta Materialia 166, 135-147 (2019) DOI: https://doi.org/10.1016/j.actamat.2018.12.034
  • 3
    R. Harrison, E.A. Holm and M. De Graef. "On the use of 2D moment invariants in the classification of additive manufacturing powder feedstock". J. Mat. Char. 149, 255-263 (2019) http://doi.org/10.1016/j.matchar.2019.01.019
  • 4
    M. De Graef, W.C. Lenthe, N. Schaefer, T. Rissom, and D. Abou-Ras. "Unambiguous determination of local orientations of polycrystalline CuInSe2 thin films via dictionary-based indexing". phys. stat. sol.  (2019) https://doi.org/10.1002/pssr.201900032
  • 5
    S. Singh, W. Lenthe, and M. De Graef. "Many-Beam Dynamical Scattering Simulations for Scanning and Transmission Electron Microscopy Modalities for 2D and 3D Quasicrystals". Phil. Mag. A (2019) https://doi.org/10.1080/14786435.2019.1605217
  • 6
    S.I. Wright, S. Singh, and M. De Graef. "Reflector Selection for the Indexing of Electron Back-Scatter Diffraction Patterns". Microscopy & Microanalysis 1-7 (2019) https://doi.org/10.1017/S1431927619000333
  • 7
    M. Jackson, E. Pascal, and M. De Graef. "Dictionary Indexing of Electron Back-Scatter Diffraction Patterns: A Hands-On Tutorial", Integrating Materials and Manufacturing Innovation,  8, 226-246 (2019) ​https://doi.org/0.1007/s40192-019-00137-4​​​
  • 8
    S. Singh, P. Kc, S.K. Sridhar, and M. De Graef. “An Iterative Reconstruction Algorithm for Pole Figure Inversion using Total Variation Regularization”. J. Appl. Crystal. 52, 1329-1341 (2019 ) ​https://doi.org/10.1107/S1600576719013529​​​
  • 9
    W.C. Lenthe, S. Singh, and M. De Graef. "A Spherical Harmonic Transform Approach to the Indexing of Electron Back-Scattered Diffraction Patterns''. Ultramicroscopy 207, 112841 (2019) ​https://doi.org/10.1016/j.ultramic.2019.112841​​​
  • 10
    W.C. Lenthe, S. Singh, and M. De Graef. "Prediction of Potential Pseudo-Symmetry Issues in the Indexing of Electron Back-Scatter Diffraction Patterns", J. Appl. Crystall. 52, 1157-1168 (2019) ​https://doi.org/10.1107/S1600576719011233​​​
  • 11
    C. Zhou, B. Dabrowski, M. De Graef, G.S. Roher and P.A. Salvador, "Combinatorial substrate epitaxy investigation of polytypic growth of AEMnO3 (AE=Ca, Sr)", J. Am. Ceram. Soc. (2019 (in press))
  • 12
    D.L. Foley, C. Pate, K. Matthews, X. Zhao, N. Savino, M. De Graef, L. Lamberson, and M.L. Taheri. "Application of Forward Modelling and Dictionary Indexing to EBSD Orientation Data as a Means of Quantifying Dislocation Substructure Formation in FCC Metals". Microscopy & MicroAnalysis, 25, S2, 208-209 (2019). ​https://doi.org/10.1017/S1431927619001776​​​
  • 13
    S.I. Wright, M. De Graef and S. Singh. "Optimizing Reflector Selection for Indexing of EBSD Patterns via Dynamic Pattern Simulation". Microscopy & MicroAnalysis, 25, S2, 206-207 (2019) ​https://doi.org/10.1017/S1431927619001764​​​
  • 14
    J. Tessmer and M. De Graef. "Simulating Thermal Noise for S/TEM Images from Atom Coordinate Data". Microscopy & MicroAnalysis, 25, S2, 210-211 (2019) ​https://doi.org/10.1017/S1431927619001788​​​
  • 15
    E. Pascal, B. Hourahine, C. Trager-Cowan, and M. De Graef. "Two beam toy model for dislocation contrast in ECCI". Microscopy & MicroAnalysis, 25, S2, 1968-1969 (2019) ​https://doi.org/10.1017/S1431927619010572​​​

Published in 2018

  • 1
    P. Callahan, J.-C. Stinville, E. Yao, M.P. Echlin, J. Shin, F. Wang, M. De Graef, T.M. Pollock, D.S. Gianola. “Defect Characterization using Transmission Scanning Electron Microscopy.”. Microsc. MicroAnal. 24-S1, 1836-1837 (2018) DOI: https://doi.org/10.1017/S1431927618009662
  • 2
    J. Tessmer, S. Singh, and M. De Graef. “Dynamical Diffraction S/TEM Simulations from Atom Coordinate Data”. Microsc. MicroAnal. 24-S1, 208-209 (2018) DOI: ​https://doi.org/10.1017/S1431927618001538​​​
  • 3
    S. Singh, M. Mills, and M. De Graef. “Dynamical Scattering Image Simulations for Two-Phase gamma-gamma' Microstructures: A Theoretical Model”. Ultramicroscopy. 185, 32-41 (2018) DOI: ​ https://doi.org/10.1016/j.ultramic.2017.11.008​​​
  • 4
    P.G. Callahan, J.-C. Stinville, E. Yao, M. Echlin, S. Daly, D.S. Gianola, M. De Graef, and T.M. Pollock. “Transmission scanning electron microscopy: Defect observations and image simulations”. Ultramicroscopy 186, 49-61 (2018) DOI: ​https://doi.org/10.1016/j.ultramic.2017.11.004​​​
  • 5
    E. Pascal, S. Singh, P.G. Callahan, and M. De Graef. “Energy-Weighted Dynamical Scattering Simulations of Back-Scattered Electron Diffraction Modalities”. Ultramicroscopy 187, 98-106 (2018) DOI: ​https://doi.org/10.1016/j.ultramic.2018.01.003​​​
  • 6
    S. Singh, F. Ram, W. Lenthe, and M. De Graef. “Dictionary-based Indexing of Large Scale Electron Back-Scatter Diffraction Data Sets”. Book Chapter in Big, Deep, Smart Data in Physical Sciences (2018 (in press))
  • 7
    P.G. Callahn, S. Singh, M. Echlin, J.C. Stinville, T.M. Pollock, and M. De Graef. “Automated Prediction of Pseudo-Symmetry Issues in EBSD”. Microsc. MicroAnal. 24-S1, 566-567 (2018) DOI: ​https://doi.org/10.1017/S143192761800332X​​​
  • 8
    K.-W. Jin and M. De Graef. “Correlation of c-axis orientation of alpha-titanium grains with polarized light optical microscopy intensity profiles”. Microsc. MicroAnal. 24-S1, 548-549 (2018) DOI: ​https://doi.org/10.1017/S1431927618003239​​​
  • 9
    J. Tessmer, S. Singh, and M. De Graef. “Dynamical Diffraction S/TEM Simulations from Atom Coordinate Data”. Microsc. MicroAnal. 24-S1, 208-209 (2018) DOI: ​https://doi.org/10.1017/S1431927618001538​​​
  • 10
    M. De Graef. “Indexing of large SEM diffraction data sets using a dictionary approach”. Microsc. MicroAnal. 24-S1, 550-551 (2018) DOI: ​https://doi.org/10.1017/S1431927618003240​​​
  • 11
    S. Singh and M. De Graef. “Integrating S/TEM Imaging Modality Simulations with Mesocale Material Simulations: A Case Study with Phase Field”. Microsc. MicroAnal. 24-S1, 212-213 (2018) DOI: ​https://doi.org/10.1017/S1431927618001551​​​
  • 12
    S. Singh and M. De Graef. “GPU accelerated Matrix Exponentiation for 5-D STEM Simulation.”. Microsc. MicroAnal. 24-S1, 222-223 (2018) DOI: ​https://doi.org/10.1017/S1431927618001605​​​
  • 13
    W.C. Lenthe, J.-C. Stinville, M.P. Echlin, Z. Chen, S. Daly, T.M. Pollock, M. De Graef. “Custom Scan Control and Time Resolved Signal Acquisition for High Resolution SEM Imaging.”. Microsc. MicroAnal. 24-S1, 536-537 (2018) DOI: ​https://doi.org/10.1017/S1431927618003173​​​
  • 14
    P. Acar, V. Sundararaghavan, and M. De Graef. “Computational Modeling of Crystallographic Texture Evolution over Cubochoric Space”. Modeling and Simulations in Materials Science and Engineering. 26, 065012 (2018)  DOI: https://doi.org/10.1088/1361-651X/aad20b
  • 15
    S. Singh, Y. Guo, B. Winiarski, T. Burnett, P.J. Withers, and M. De Graef. “High resolution low kV EBSD of heavily deformed and nanocrystalline Aluminium by dictionary-based indexing”. Nature Scientific Reports,  8:10991 (2018) DOI: https://doi.org/10.1038/s41598-018-29315-8
  • 16
    A. Nicolay, J.M. Franchet, J. Cormier, H. Mansour, M. De Graef, A. Seret, and N. Bozzolo, “Discrimination of dynamically and post-dynamically recrystallized grains based on EBSD data. Application to Inconel 718”. J. Microsc. (2018 (in press)) DOI: https://doi.org/10.1111/jmi.12769

Published in 2017

  • 1
    Marquardt, K. and De Graef, M. and Singh, S. and Marquardt, H. and Rosenthal, A. and Hiraga, T. "Quantitative electron backscatter diffraction (EBSD) data analyses using the dictionary indexing (DI) approach: overcoming indexing difficulties in geological materials", American Mineralogist, 102, 1843-1855 (2017) DOI: ​http://dx.doi.org/10.2138/am-2017-6062​​​
  • 2
    E. Pascal, S. Singh, B. Houahine, C. Trager-Cowan, and M. De Graef. "Dynamical Simulations of Transmission Kikuchi Diffraction (TKD) Patterns", Microscopy and MicroAnalysis, 23:S1, 540-541 (2017) DOI: ​http://dx.doi.org/10.1017/S1431927617003385​​​
  • 3
    S. Singh, F. Ram, and M. De Graef. "EMsoft: Open Source Software for Electron Diffraction/Image Simulations", Microscopy and MicroAnalysis, 23:S1, 212-213 (2017) DOI: ​http://dx.doi.org/10.1017/S143192761700174X​​​
  • 4
    J. Tessmer, M. De Graef, and Y. Picard. "Investigating Defect Contrast in GeXSi1-x/Si Epitaxial Structures Using Electron Channeling Contrast Imaging", Microscopy and MicroAnalysis, 23:S1, 454-455 (2017) DOI: ​http://dx.doi.org/10.1017/S1431927617003555​​​​
  • 5
    J. Tessmer, S. Singh, Y. Picard, and M. De Graef. "Automated Acquisition and Analysis of Selected Area Electron Channeling Patterns in an FEG-SEM;", Microscopy and MicroAnalysis, 23:S1, 550-551 (2017) DOI: ​http://dx.doi.org/10.1017/S1431927617003439​​​​
  • 6
    S. Singh, A. Leff, M. Taheri, and M. De Graef. "Applications of Forward Modeling to Refinement of Grain Orientations", Microscopy and MicroAnalysis, 23:S1, 594-595 (2017) DOI: ​http://dx.doi.org/10.1017/S1431927617003658​​​
  • 7
    P.G. Callahan, M. Echlin, T.M. Pollock, F. Ram, S. Singh, and M. De Graef. “3D Texture Visualization Approaches: Applications to Nickel and Titanium Alloys”. J. Appl. Crystall. 50, 1267-1279 (2017). DOI: ​http://dx.doi.org/10.1107/S1600576717010470​​​
  • 8
    S. Singh, F. Ram, and M. De Graef. “Application of Forward Models to Crystal Orientation Refinement”. J. Appl. Crystall. 50, 1664-1676 (2017) DOI: ​http://dx.doi.org/10.1107/S1600576717014200​​​